New research from CORPE

Fuse Modeling for Reliability Study of Power Electronic System By Amir Sajjad Bahman, Francesco Iannuzzo and Frede Blaabjerg

Last modified: 21.01.2018

Published in: Proceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC)

DOI (link to publication from Publisher): 10.1109/APEC.2017.7930792

Direct link to the publication

Figure 1: Cartridge fuse and structure.

Figure 2: Von Mises stress in the fuse element with temperature cycling.


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